Contribution to size effect of yield strength from the stochastics of dislocation source lengths in finite samples

被引：462
作者：
Parthasarathy, Triplicane A.
Rao, Satish I.
Dimiduk, Dennis M.
Uchic, Michael D.
Trinkle, Dallas R.
机构：
[1] Universal Energy Syst Inc, Dayton, OH 45432 USA
[2] USAF, Res Lab, Mat & Mfg Directorate, MLLM, Wright Patterson AFB, OH 45433 USA
来源：
SCRIPTA MATERIALIA | 2007年 / 56卷 / 04期
关键词：
size; yield; stochastics; dislocation; source;
D O I：
10.1016/j.scriptamat.2006.09.016
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Recent works show that the yield strength of metals increases steeply with decreasing sample size. In this work, it is shown that this sample size effect can be rationalized almost completely by considering the stochastics of dislocation source lengths in samples of finite size. The statistical first and second moments of the effective source length are derived as a function of sample size. The sample strength predicted from this effective length compares well with data. (c) 2006 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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收藏
页码：313 / 316
页数：4
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