Temperature dependence of current-voltage of Al/p-Si(100) and Ti/p-Si(100) Schottky barrier diodes

被引:0
|
作者
Vazquez, Arely [1 ]
Molina, Joel [1 ]
机构
[1] Inst Nacl Astrofis Opt & Elect INAOE, Elect, Puebla, Mexico
来源
2022 IEEE LATIN AMERICAN ELECTRON DEVICES CONFERENCE (LAEDC) | 2022年
关键词
Schottky barrier height; temperature; fabrication; current-voltage; Schottky barrier diode;
D O I
10.1109/LAEDC54796.2022.9908217
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The current-voltage (I-V) characteristics on Al/p-Si (100) and Ti/p-Si (100) Schottky barrier diodes (SD) in the temperature range of 25-85 degrees C were carried out. The Schottky barrier height (SBH) and ideality factor n calculated for both metal-semiconductor (MS) structures by using thermionic emission theory showed a strong dependence on temperature. The metals employed (titanium and aluminum) during the fabrication process were characterized to obtain electrical and physical parameters.
引用
收藏
页数:4
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