Fabrication of antireflective nanostructures for crystalline silicon solar cells by reactive ion etching

被引:5
作者
Lin, Hsin-Han [2 ]
Chen, Wen-Hua [2 ]
Wang, Chi-Jen [4 ]
Hong, Franklin Chau-Nan [1 ,2 ,3 ]
机构
[1] Natl Cheng Kung Univ, Dept Chem Engn, Tainan 70101, Taiwan
[2] Natl Cheng Kung Univ, Inst Nanotechnol & Microsyst Engn, Tainan 70101, Taiwan
[3] Natl Cheng Kung Univ, Micronano Imprinting Technol & Device Ctr, Tainan 70101, Taiwan
[4] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 70101, Taiwan
关键词
Antireflection; Reactive ion etching (RIE); Reflectivity; ABSORPTION; NANOWIRE; ALUMINA;
D O I
10.1016/j.tsf.2012.09.047
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study we have fabricated large-area (15x15 cm(2)) subwavelength antireflection structure on poly-Si substrates to reduce their solar reflectivity. A reactive ion etching system was used to fabricate nanostructures on the poly-silicon surface. Reactive gases, composed of chlorine (Cl-2), sulfur hexafluoride (SF6) and oxygen (O-2), were activated to fabricate nanoscale pyramids by RF plasma. The poly-Si substrates were etched in various gas compositions for 6-10 min to form nano-pyramids. The sizes of pyramids were about 200-300 nm in heights and about 100 nm in width. Besides the nanoscale features, the high pyramid density on the poly-Si surface is another important factor to reduce the reflectivity. Low-reflectivity surface was fabricated with reflectivity significantly reduced down to <2% for photons in a wavelength range of 500-900 nm. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:138 / 142
页数:5
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