Three dimensional characterization of trace element distribution in high purity chromium

被引：9

作者：

Hutter, H ^{[1
]}

Brunner, C ^{[1
]}

Wilhartitz, P ^{[1
]}

Grasserbauer, M ^{[1
]}

机构：

[1] MET WERK PLANSEE GMBH,A-6600 REUTTE,AUSTRIA

来源：

MIKROCHIMICA ACTA | 1996年 / 122卷 / 3-4期

关键词：

corrosion; material science; grain boundaries; imaging;

D O I：

10.1007/BF01245782

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The investigation of the distribution of trace elements in two chromium samples with different corrosion resistivity is reported. The concentration of the trace elements in both samples is in the typical range of high purity chromium and did not explain the different behaviour in the corrosion test. To measure the three-dimensional distribution imaging secondary ion mass spectrometry (SIMS) was used. Fine details were measured by scanning SIMS because of the better resolution. An enrichment of nitrogen and carbon at the grain boundaries of the sample with lower corrosion resistivity was observed.

引用

页码：195 / 202

页数：8

共 6 条

[1] A MICROCOMPUTER BASED DIGITAL IMAGING-SYSTEM FOR ION MICROANALYSIS [J].