Fragmentation analysis and α-decay half-lives of trans-Sn nuclei

被引:4
作者
Sharma, Kanishka [1 ]
Sharma, Manoj K. [1 ]
机构
[1] Thapar Inst Engn & Technol, Sch Phys & Mat Sci, Patiala 147004, Punjab, India
关键词
Alpha-decay; Decay half-life; Binary fragmentation; RADIOACTIVE DECAY; MODEL; STATES;
D O I
10.1016/j.nuclphysa.2019.03.001
中图分类号
O57 [原子核物理学、高能物理学];
学科分类号
070202 ;
摘要
The triple alpha-decay chain Ba-114 -> (alpha) Xe-110 -> (alpha) Te-106 -> (alpha) Sn-102 gives three new alpha-emitters Ba-114, Xe-110 and Te-106. In order to explore the excited state alpha-decay, the dynamics of Ni-58(Ni-58,2n) reaction forming Ba-116* is studied at the beam energy E-Lab = 210 MeV. The half-lives of the nuclei formed in successive alpha-decay chain are calculated using Dynamical Cluster decay Model (DCM), an extension of the Preformed Cluster Model (PCM) with temperature T- and angular momentum l-effects included. In addition to this, the alpha-decay half-lives of some trans-Sn Te, I, Xe, Cs and Ba isotopes, lying near the super-allowed region of alpha-decay, have been addressed in view of ground state alpha-radioactivity. The role of various proximity potentials having different isospin dependence is investigated in order to extract the useful information about the barrier characteristics in decay of trans-Sn region nuclei. The preformation probability distribution, which gives an account of potential energy surfaces, is analyzed for the relative comparison of spontaneous and induced alpha-emission processes. (C) 2019 Elsevier B.V. All rights reserved.
引用
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页码:1 / 17
页数:17
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