Carrier transport in nanodevices

被引:8
作者
Ferry, DK
Akis, R
Udipi, S
Vasileska, D
Pivin, DP
Connolly, KM
Bird, JP
Ishibashi, K
Aoyagi, Y
Sugano, T
Ochiai, Y
机构
[1] ARIZONA STATE UNIV,DEPT ELECT ENGN,TEMPE,AZ 85287
[2] ARIZONA STATE UNIV,CTR SYST SCI & ENGN,TEMPE,AZ 85287
[3] RIKEN,FRONTIER RES PROGRAM,WAKO,SAITAMA 35101,JAPAN
[4] CHIBA UNIV,MAT RES DEPT,INAGE KU,CHIBA 263,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1997年 / 36卷 / 3B期
关键词
inhomogeneities; device physics; quantum dots; quantum transport; device modeling; random impurities;
D O I
10.1143/JJAP.36.1841
中图分类号
O59 [应用物理学];
学科分类号
摘要
Future VLSI scaling realization of gate lengths is expected to 70 nm and below. While we do not know all the underlying physics, we are beginning to understand some limiting factors; which include quantum transport, in these structures. The discrete nature of impurities, the fact that devices have critical lengths comparable to their coherence lengths, and size quantization will all be important in these structures. These phenomena will lead to pockets of charge, which will appear as coupled quantum dots in the device transport. We review some of the physics of these dots.
引用
收藏
页码:1841 / 1845
页数:5
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