共 23 条
[2]
Characterization of Ge2Sb2Te5 thin film alloys using conductive-tip atomic force microscopy
[J].
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS,
2012, 249 (10)
:1945-1950
[10]
Matsunaga T, 2011, NAT MATER, V10, P129, DOI [10.1038/nmat2931, 10.1038/NMAT2931]