Single-shot pulse duration monitor for extreme ultraviolet and X-ray free-electron lasers

被引:83
作者
Riedel, R. [1 ,2 ]
Al-Shemmary, A. [3 ]
Gensch, M. [4 ]
Golz, T. [3 ]
Harmand, M. [3 ]
Medvedev, N. [5 ]
Prandolini, M. J. [2 ]
Sokolowski-Tinten, K. [6 ,7 ]
Toleikis, S. [3 ]
Wegner, U. [3 ]
Ziaja, B. [5 ,8 ]
Stojanovic, N. [3 ]
Tavella, F. [2 ]
机构
[1] Univ Hamburg, D-22761 Hamburg, Germany
[2] Helmholtz Inst Jena, D-07743 Jena, Germany
[3] Deutsch Elekt Synchrotron DESY, D-22607 Hamburg, Germany
[4] Helmholtz Zent Dresden Rossendorf, D-01328 Dresden, Germany
[5] Ctr Free Elect Laser Sci DESY, D-22607 Hamburg, Germany
[6] Univ Duisburg Essen, Fac Phys, D-47048 Duisburg, Germany
[7] Univ Duisburg Essen, Ctr Nanointegrat Duisburg Essen CENIDE, D-47048 Duisburg, Germany
[8] Inst Nucl Phys, PAN, PL-31342 Krakow, Poland
关键词
SCATTERING; OPERATION; DYNAMICS;
D O I
10.1038/ncomms2754
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The resolution of ultrafast studies performed at extreme ultraviolet and X-ray free-electron lasers is still limited by shot-to-shot variations of the temporal pulse characteristics. Here we show a versatile single-shot temporal diagnostic tool that allows the determination of the extreme ultraviolet pulse duration and the relative arrival time with respect to an external pump-probe laser pulse. This method is based on time-resolved optical probing of the transient reflectivity change due to linear absorption of the extreme ultraviolet pulse within a solid material. In this work, we present measurements performed at the FLASH free-electron laser. We determine the pulse duration at two distinct wavelengths, yielding (184 +/- 14) fs at 41.5nm and (21 +/- 19) fs at 5.5 nm. Furthermore, we demonstrate the feasibility to operate the tool as an online diagnostic by using a 20-nm-thin Si3N4 membrane as target. Our results are supported by detailed numerical and analytical investigations.
引用
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页数:7
相关论文
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