Communication Functions for a Gate Driver Under High Voltage and High dv/dt

被引:8
|
作者
Bouguet, Christophe [1 ,2 ]
Ginot, Nicolas [1 ]
Batard, Christophe [1 ]
机构
[1] Univ Bretagne Loire, Univ Nantes, Inst Elect & Telecommun Rennes, Polytech Nantes,UMR 6164, Rue C Pauc BP 50609, F-44306 Nantes, France
[2] ECA Grp ZAC Hauts de Coueron, 24 Rue Jan Palach, F-44220 Coueron, France
关键词
Communication channel; controller area network (CAN); driver; electrical isolation; MOSFET SiC; power electronics;
D O I
10.1109/TPEL.2017.2750744
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The control of MOSFET or IGBT transistors is carried out by a dedicated circuit called << driver >>, which is located as close as possible to the power module. It transmits switch-ON and switch-OFF orders coming from the control unit and ensures the integrity of the component through safety functions. It also provides a galvanic isolation essential to guarantee the effective functioning of the system and the users' safety. Switching times of SiC MOSFET are faster than Si IGBT, and SiC MOSFET can also work under a greater dc voltage than Si MOSFET. This involves the presence of higher dv/dt in the converter. In this paper, a communication function is studied to be integrated into the new generations of drivers for SiC MOSFET. The interest of the implementation of a communication system in a driver is presented. Currently available solutions on the market to provide isolation to communication channels are debated. The theoretical development of a solution called << CAN-ISO >> is detailed and experimental results under a high peak voltage of 2 kV and a high dv/dt equal to 125 kV/mu s are presented.
引用
收藏
页码:6137 / 6146
页数:10
相关论文
共 50 条
  • [1] A Gate Driver Design for Medium Voltage Silicon Carbide Power Devices with High dv/dt
    Anurag, Anup
    Acharya, Sayan
    Gohil, Ghanshyamsinh
    Bhattacharya, Subhashish
    IECON 2018 - 44TH ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, 2018, : 877 - 882
  • [2] A Gate-Driver Architecture with High Common-Mode Noise Immunity under Extremely High dv/dt
    Wang, Zhongjing
    Yuan, Zhao
    Zhao, Yue
    2021 THIRTY-SIXTH ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC 2021), 2021, : 2532 - 2536
  • [3] Design Considerations and Development of an Innovative Gate Driver for Medium-Voltage Power Devices With High dv/dt
    Anurag, Anup
    Acharya, Sayan
    Prabowo, Yos
    Gohil, Ghanshyamsinh
    Bhattacharya, Subhashish
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2019, 34 (06) : 5256 - 5267
  • [4] Induced Gate-Source Voltage Mechanism and Gate Driver Design in All-SiC PWM Rectifier with Ultra-High Voltage Slew Rate (dv/dt)
    Shao, Tiancong
    Li, Zhijun
    Wang, Zuoxing
    Zheng, Trillion Q.
    Li, Hong
    Huang, Bo
    Zhang, Zhipeng
    2020 IEEE 9TH INTERNATIONAL POWER ELECTRONICS AND MOTION CONTROL CONFERENCE (IPEMC2020-ECCE ASIA), 2020, : 1863 - 1867
  • [5] dv/dt Noise canceling circuit in ultra-high-voltage MOS gate drivers
    Zhao, Yong-Rui
    Lai, Xin-Quan
    Du, Han-Xiao
    Liu, Cong
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2013, 77 (02) : 271 - 276
  • [6] dv/dt Noise canceling circuit in ultra-high-voltage MOS gate drivers
    Yong-Rui Zhao
    Xin-Quan Lai
    Han-Xiao Du
    Cong Liu
    Analog Integrated Circuits and Signal Processing, 2013, 77 : 271 - 276
  • [7] Closed-Loop di/dt and dv/dt IGBT Gate Driver
    Lobsiger, Yanick
    Kolar, Johann W.
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2015, 30 (06) : 3402 - 3417
  • [8] Improving Voltage Sensor Noise Immunity in a High Voltage and High dv/dt Environment
    Palmer, James
    Ji, Shiqi
    Huang, Xingxuan
    Zhang, Li
    Giewont, William
    Wang, Fei
    Tolbert, Leon M.
    2020 THIRTY-FIFTH ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC 2020), 2020, : 107 - 113
  • [9] A 400-V Half Bridge Gate Driver for Normally-Off GaN HEMTs With Effective Dv/Dt Control and High Dv/Dt Immunity
    Yu, Siyuan
    Zhou, Qi
    Shi, Gang
    Wu, Tianyang
    Zhu, Jing
    Zhang, Long
    Sun, Weifeng
    Zhang, Sen
    He, Nailong
    Li, Ye
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2023, 70 (01) : 741 - 751
  • [10] Advanced gate driver for IGBT devices with dv/dt and peak voltage limitation based on active gate-emitter voltage control
    Hoeer, Martin
    Filsecker, Felipe
    Wagner, Martin
    Bernet, Steffen
    2016 18TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'16 ECCE EUROPE), 2016,