A representative-sandwich model for simultaneously coupled mechanical-electrical-thermal simulation of a lithium-ion cell under quasi-static indentation tests

被引:114
作者
Zhang, Chao [1 ]
Santhanagopalan, Shriram [2 ]
Sprague, Michael A. [1 ]
Pesaran, Ahmad A. [2 ]
机构
[1] Natl Renewable Energy Lab, Computat Sci Ctr, Golden, CO 80401 USA
[2] Natl Renewable Energy Lab, Transportat & Hydrogen Syst Ctr, Golden, CO 80401 USA
关键词
Lithium-ion battery; Short circuit; Multi-physics simulation; Mechanical crush; Temperature ramp; Indentation; FINITE-ELEMENT SIMULATION; BATTERY CELLS; SHORT-CIRCUIT; LOADING CONDITIONS; VOLUME ELEMENTS; BEHAVIOR; COMPRESSION; SEPARATOR; ABUSE; IMPACT;
D O I
10.1016/j.jpowsour.2015.08.049
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The safety behavior of lithium-ion batteries under external mechanical crush is a critical concern, especially during large-scale deployment. We previously presented a sequentially coupled mechanical-electrical-thermal modeling approach for studying mechanical-abuse-induced short circuit. In this work, we study different mechanical test conditions and examine the interaction between mechanical failure and electrical-thermal responses, by developing a simultaneously coupled mechanical-electrical-thermal model. The present work utilizes a single representative-sandwich (RS) to model the full pouch cell with explicit representations for each individual component such as the active material, current collector, separator, etc. Anisotropic constitutive material models are presented to describe the mechanical properties of active materials and separator. The model predicts accurately the force-strain response and fracture of battery structure, simulates the local failure of separator layer, and captures the onset of short circuit for lithium-ion battery cells under sphere indentation tests with three different diameters. Electrical-thermal responses to the three different indentation tests are elaborated and discussed. Numerical studies are presented to show the potential impact of test conditions on the electrical-thermal behavior of the cell after the occurrence of short circuit. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:309 / 321
页数:13
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