Surface plasmon polaritons assisted diffraction in metal films with subwavelength hole array

被引：1
|
作者：
Fang, X.
Wei, H. X.
Kamran, M.
Ma, J. Y.
Zhao, H. Y.
Han, X. F.
Qiu, X. G. [1 ]
机构：
[1] Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Beijing 100080, Peoples R China
来源：
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 2008年 / 69卷 / 12期
基金：
中国国家自然科学基金;
关键词：
D O I：
10.1016/j.jpcs.2008.06.099
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Metal films grown on Si wafer have been perforated with a periodic hole array and anomalous enhanced transmission in the subwavelength regime has been observed. High-order transmission peaks up to Si(2,2) are clearly revealed due to the large dielectric constant of Si against that of the air. Si(1,1) peak splits into two branches at oblique incidence both in TE and in TM polarization, which confirms that anomalous enhanced transmission is a surface plasmon polaritons (SPPs) assisted diffraction phenomenon. (C) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码：3093 / 3095
页数：3
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