Reliability prediction and real world for LED lamps

被引：0
|
作者：
Mura, G. [1 ]
Vanzi, M. [1 ]
机构：
[1] Univ Cagliari, DIEE Dept Elect & Elect Engn, I-09134 Cagliari, Italy
来源：
2014 IEEE 21ST INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA) | 2014年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The paper focuses on Reliability of Reliability Predictions by comparison with available Reliability Data Sheet and Accelerated Stress Test results on commercially available devices. The striking difference in the predicted MTTFs (Mean Time To Failure) is discussed.
引用
收藏
页码：207 / 210
页数：4
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