Thickness contrast of few-layered graphene in SEM

被引：38

作者：

Park, Min-Ho ^{[1
]}

Kim, Tae-Hoon ^{[1
]}

Yang, Cheol-Woong ^{[1
]}

机构：

[1] Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, Gyeonggi Do, South Korea

来源：

SURFACE AND INTERFACE ANALYSIS | 2012年 / 44卷 / 11-12期

基金：

新加坡国家研究基金会;

关键词：

graphene; thickness contrast; SEM; work function; CARBON; FUNCTIONALIZATION;

D O I：

10.1002/sia.4995

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We observed graphene flakes on a SiO2/Si substrate and confirmed the variation in the thickness of the flakes by optical microscopy, Raman spectroscopy and scanning electron microscopy (SEM). We were able to clearly distinguish the thickness variation of the graphene provided a low primary electron acceleration voltage was used. It was found that different contrasts in SEM images at low acceleration voltages could be attributed to the fact that the generation of secondary electrons emitted from the graphene was affected by the different work functions that corresponded to the number of graphene layers. Copyright (C) 2012 John Wiley & Sons, Ltd.

引用

页码：1538 / 1541

页数：4

共 18 条

[1] Making graphene visible [J].

Blake, P. ;

Hill, E. W. ;

Castro Neto, A. H. ;

Novoselov, K. S. ;

Jiang, D. ;

Yang, R. ;

Booth, T. J. ;

Geim, A. K. .

APPLIED PHYSICS LETTERS, 2007, 91 (06)

[2] Material contrast in SEM: Fermi energy and work function effects [J].

Cazaux, Jacques .

ULTRAMICROSCOPY, 2010, 110 (03) :242-253

[3] Spontaneous reduction of metal ions on the sidewalls of carbon nanotubes [J].

Choi, HC ;

Shim, M ;

Bangsaruntip, S ;

Dai, HJ .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2002, 124 (31) :9058-9059

[4] SIMPLE CALCULATION OF ENERGY-DISTRIBUTION OF LOW-ENERGY SECONDARY ELECTRONS EMITTED FROM METALS UNDER ELECTRON-BOMBARDMENT [J].

CHUNG, MS ;

EVERHART, TE .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (02) :707-709

[5]

Craciun MF, 2009, NAT NANOTECHNOL, V4, P383, DOI [10.1038/NNANO.2009.89, 10.1038/nnano.2009.89]

[6] Raman spectrum of graphene and graphene layers [J].

Ferrari, A. C. ;

Meyer, J. C. ;

Scardaci, V. ;

Casiraghi, C. ;

Lazzeri, M. ;

Mauri, F. ;

Piscanec, S. ;

Jiang, D. ;

Novoselov, K. S. ;

Roth, S. ;

Geim, A. K. .

PHYSICAL REVIEW LETTERS, 2006, 97 (18)

[7] The rise of graphene [J].

Geim, A. K. ;

Novoselov, K. S. .

NATURE MATERIALS, 2007, 6 (03) :183-191

[8] Organic functionalization of carbon nanotubes [J].

Georgakilas, V ;

Kordatos, K ;

Prato, M ;

Guldi, DM ;

Holzinger, M ;

Hirsch, A .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2002, 124 (05) :760-761

[9] Raman scattering from high-frequency phonons in supported n-graphene layer films [J].

Gupta, A. ;

Chen, G. ;

Joshi, P. ;

Tadigadapa, S. ;

Eklund, P. C. .

NANO LETTERS, 2006, 6 (12) :2667-2673

[10] Microscopic thickness determination of thin graphite films formed on SiC from quantized oscillation in reflectivity of low-energy electrons [J].

Hibino, H. ;

Kageshima, H. ;

Maeda, F. ;

Nagase, M. ;

Kobayashi, Y. ;

Yamaguchi, H. .

PHYSICAL REVIEW B, 2008, 77 (07)

← 1 2 →