Characterization of the Displacement Tolerance of QCA Interconnects

被引:7
作者
Karim, Faizal [1 ]
Walus, Konrad [1 ]
机构
[1] Univ British Columbia, Dept Elect & Comp Engn, Microsyst & Nanotechnol Res Grp, Vancouver, BC V6T 1Z4, Canada
来源
IEEE INTERNATIONAL WORKSHOP ON DESIGN AND TEST OF NANO DEVICES, CIRCUITS AND SYSTEMS, PROCEEDINGS | 2008年
关键词
D O I
10.1109/NDCS.2008.9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Quantum-Dot Cellular Automata (QCA) is one of several emerging nanoscale devices that is targeted at scalable molecular electronics. In this paper, the tolerance to cell displacements of a QCA interconnect is analysed in order to determine limits on allowable displacements, as well as to identify the important failure mechanisms. Numerical simulations using the coherence vector formalism are performed for a short length of QCA interconnect under various conditions. Contrary to previous work, our results indicate that wider interconnects display a higher sensitivity to cell displacements due to the formation of cell clusters, which are more prominent in wider interconnects as a result of the increased number of cells.
引用
收藏
页码:49 / 52
页数:4
相关论文
共 28 条
[1]  
[Anonymous], 38 AS C SIGN SYST CO
[2]  
Blair EP, 2003, 2003 THIRD IEEE CONFERENCE ON NANOTECHNOLOGY, VOLS ONE AND TWO, PROCEEDINGS, P402
[3]  
BLAIR EP, 2003, TOOLS DESIGN SIMULAT
[4]  
BLAIR EP, 2001, 3 IEEE C NAN, V1, P402
[5]  
FINJAY A, 2001, J NANOPART RES, V3, P27
[6]  
GUPTA P, 2006, TEST GENERATION COMB
[7]   A test generation framework for quantum cellular automata circuits [J].
Gupta, Pallav ;
Jha, Niraj K. ;
Lingappan, Loganathan .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2007, 15 (01) :24-36
[8]   Clocking of molecular quantum-dot cellular automata [J].
Hennessy, K ;
Lent, CS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (05) :1752-1755
[9]   High-resolution electron beam lithography and DNA nano-patterning for molecular QCA [J].
Hu, WC ;
Sarveswaran, K ;
Lieberman, M ;
Bernstein, GH .
IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2005, 4 (03) :312-316
[10]   Fault tolerance calculations for clocked quantum-dot cellular automata devices [J].
Khatun, M ;
Barclay, T ;
Sturzu, I ;
Tougaw, PD .
JOURNAL OF APPLIED PHYSICS, 2005, 98 (09)