Strong Molecular Alignment Dependence of H2 Electron Impact Ionization Dynamics

被引：39

作者：

Ren, X. ^{[1
]}

Pflueger, T. ^{[2
]}

Xu, S. ^{[3
]}

Colgan, J. ^{[4
]}

Pindzola, M. S. ^{[5
]}

Senftleben, A. ^{[1
]}

Ullrich, J. ^{[1
,2
]}

Dorn, A. ^{[1
]}

机构：

[1] Max Planck Inst Nucl Phys, D-69117 Heidelberg, Germany

[2] Phys Tech Bundesanstalt, D-38116 Braunschweig, Germany

[3] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China

[4] Los Alamos Natl Lab, Div Theoret, Los Alamos, NM 87545 USA

[5] Auburn Univ, Dept Phys, Auburn, AL 36849 USA

来源：

PHYSICAL REVIEW LETTERS | 2012年 / 109卷 / 12期

基金：

美国国家科学基金会;

关键词：

PHOTOELECTRON ANGULAR-DISTRIBUTIONS; MOMENTUM SPECTROSCOPY; PHOTOIONIZATION; ION;

D O I：

10.1103/PhysRevLett.109.123202

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Low-energy (E-0 = 54 eV) electron impact single ionization of molecular hydrogen (H-2) has been investigated as a function of molecular alignment in order to benchmark recent theoretical predictions [Colgan et al., Phys. Rev. Lett. 101, 233201 (2008) and Al-Hagan et al., Nature Phys. 5, 59 (2009)]. In contrast to any previous work, we observe distinct alignment dependence of the (e, 2e) cross sections in the perpendicular plane in good overall agreement with results from time-dependent close-coupling calculations. The cross section behavior can be consistently explained by a rescattering of the ejected electron in the molecular potential resulting in an effective focusing along the molecular axis.

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页数：5

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