Strong Molecular Alignment Dependence of H2 Electron Impact Ionization Dynamics

被引:39
|
作者
Ren, X. [1 ]
Pflueger, T. [2 ]
Xu, S. [3 ]
Colgan, J. [4 ]
Pindzola, M. S. [5 ]
Senftleben, A. [1 ]
Ullrich, J. [1 ,2 ]
Dorn, A. [1 ]
机构
[1] Max Planck Inst Nucl Phys, D-69117 Heidelberg, Germany
[2] Phys Tech Bundesanstalt, D-38116 Braunschweig, Germany
[3] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
[4] Los Alamos Natl Lab, Div Theoret, Los Alamos, NM 87545 USA
[5] Auburn Univ, Dept Phys, Auburn, AL 36849 USA
基金
美国国家科学基金会;
关键词
PHOTOELECTRON ANGULAR-DISTRIBUTIONS; MOMENTUM SPECTROSCOPY; PHOTOIONIZATION; ION;
D O I
10.1103/PhysRevLett.109.123202
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Low-energy (E-0 = 54 eV) electron impact single ionization of molecular hydrogen (H-2) has been investigated as a function of molecular alignment in order to benchmark recent theoretical predictions [Colgan et al., Phys. Rev. Lett. 101, 233201 (2008) and Al-Hagan et al., Nature Phys. 5, 59 (2009)]. In contrast to any previous work, we observe distinct alignment dependence of the (e, 2e) cross sections in the perpendicular plane in good overall agreement with results from time-dependent close-coupling calculations. The cross section behavior can be consistently explained by a rescattering of the ejected electron in the molecular potential resulting in an effective focusing along the molecular axis.
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收藏
页数:5
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