Structural and optical properties of single and bilayer silver and gold films

被引：17

作者：

Yankovskii, G. M. ^{[1
,2
]}

Komarov, A. V. ^{[1
,3
]}

Puz'ko, R. S. ^{[1
,3
]}

Baryshev, A. V. ^{[1
,3
,4
]}

Afanas'ev, K. N. ^{[1
,5
,6
]}

Boginskaya, I. A. ^{[1
,5
,6
]}

Bykov, I. V. ^{[1
,5
,6
]}

Merzlikin, A. M. ^{[1
,3
,5
]}

Rodionov, I. A. ^{[1
,6
]}

Ryzhikov, I. A. ^{[1
,5
,6
]}

机构：

[1] Dukhov All Russia Res Inst Automat, Ul Sushchevskaya 22, Moscow 127055, Russia

[2] MISiS Natl Univ Sci & Technol, Leninskii Pr 4, Moscow 119049, Russia

[3] State Univ, Moscow Inst Phys & Technol, Inst Skii Per 4, Dolgoprudnyi 141700, Moscow Oblast, Russia

[4] Russian Acad Sci, Ioffe Inst, Politekhnicheskaya Ul 26, St Petersburg 194021, Russia

[5] Russian Acad Sci, Inst Theoret & Appl Electrodynam, Ul Izhorskaya 13, Moscow 125412, Russia

[6] Bauman Moscow State Tech Univ, Vtoraya Baumanskaya Ul 5, Moscow 107005, Russia

来源：

PHYSICS OF THE SOLID STATE | 2016年 / 58卷 / 12期

关键词：

EXCITATION; CONSTANTS; THICKNESS; AU; AG;

D O I：

10.1134/S1063783416120349

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

An experimental study of structural and optical properties of silver and gold thin films, as well as bilayer films based on these metals, has been carried out. To study properties of nanofilms, reflection spectra upon excitation of surface plasmons in the Kretschmann geometry and spectra of ellipsometric parameters have been investigated. The reflection spectra were analyzed using a theoretical model for determining (effective) dielectric constants of the films. The calculated dielectric constants of the films differ from data obtained by ellipsometry. The features in determining dielectric constants by different methods and characteristics of manufactured films in relation to the influence of the substrate are discussed.

引用

页码：2503 / 2510

页数：8

共 35 条

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[Anonymous], 2006, Lectures on Computational Mathematics

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