Structural features of spin-coated thin films of binary AsxS100-x chalcogenide glass system

被引：10

作者：

Cook, J. ^{[1
]}

Slang, S. ^{[2
]}

Golovchak, R. ^{[1
]}

Jain, H. ^{[3
]}

Vlcek, M. ^{[2
]}

Kovalskiy, A. ^{[1
]}

机构：

[1] Austin Peay State Univ, Clarksville, TN 37075 USA

[2] Univ Pardubice, Fac Chem Technol, Pardubice 53210, Czech Republic

[3] Lehigh Univ, Int Mat Inst New Funct Glass, Bethlehem, PA 18015 USA

来源：

THIN SOLID FILMS | 2015年 / 589卷

基金：

美国国家科学基金会;

关键词：

Spin-coated films; Chalcogenide glass; X-ray photoelectron spectroscopy; Raman spectroscopy; AS-S GLASSES; PHOTOINDUCED CHANGES; THERMAL EVAPORATION; RAMAN-SPECTROSCOPY; TRANSFORMATIONS; SURFACE; AS2S3; BULK;

D O I：

10.1016/j.tsf.2015.06.049

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Spin-coating technology offers a convenient method for fabricating photostable chalcogenide glass thin films that are especially attractive for applications in IR optics. In this paper we report the structure of spin-coated AsxS100 (-) (x) (x = 30, 35, 40) thin films as determined using high resolution X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy, especially in relation to composition (i.e. As/S ratio) and preparation process variables. It was observed that As atoms during preparation have a tendency to precipitate out in close to stoichiometric compositions. The mechanism of bonding between the inorganic matrix and organic residuals is discussed based on the experimental data. A weak interaction between S ions and amine-based clusters is proposed as the basis of structural organization of the organic-inorganic interface. (C) 2015 Elsevier B.V. All rights reserved.

引用

页码：642 / 648

页数：7

共 45 条

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[2]

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