Electronic structure of N-doped graphene with native point defects

被引:112
作者
Hou, Zhufeng [1 ]
Wang, Xianlong [1 ]
Ikeda, Takashi [2 ]
Terakura, Kiyoyuki [1 ,3 ]
Oshima, Masaharu [4 ]
Kakimoto, Masa-aki [1 ]
机构
[1] Tokyo Inst Technol, Dept Organ & Polymer Mat, Grad Sch Sci & Engn, Ookayama, Tokyo 1528552, Japan
[2] Japan Atom Energy Agcy, Quantum Beam Sci Directorate, Condensed Matter Sci Div, Sayo, Hyogo 6795148, Japan
[3] Japan Adv Inst Sci & Technol, Res Ctr Integrated Sci, Nomi, Ishikawa 9231292, Japan
[4] Univ Tokyo, Dept Appl Chem, Tokyo 1138656, Japan
关键词
OXYGEN REDUCTION REACTION; X-RAY-ABSORPTION; PHOTOELECTRON-SPECTRA; CATHODE CATALYSTS; NITROGEN; CARBON; IRON; ELECTROCATALYSTS; SPECTROSCOPY; DENSITY;
D O I
10.1103/PhysRevB.87.165401
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Nitrogen doping in graphene has important implications in graphene-based devices and catalysts. We have performed the density functional theory calculations to study the electronic structures of N-doped graphene with vacancies and Stone-Wales defect. Our results show that monovacancies in graphene act as hole dopants and that two substitutional N dopants are needed to compensate for the hole introduced by a monovacancy. On the other hand, divacancy does not produce any free carriers. Interestingly, a single N dopant at divacancy acts as an acceptor rather than a donor. The interference between native point defect and N dopant strongly modifies the role of N doping regarding the free carrier production in the bulk pi bands. For some of the defects and N dopant-defect complexes, localized defect pi states are partially occupied. Discussion on the possibility of spin polarization in such cases is given. We also present qualitative arguments on the electronic structures based on the local bond picture. We have analyzed the 1s-related x-ray photoemission and adsorption spectroscopy spectra of N dopants at vacancies and Stone-Wales defect in connection with the experimental ones. We also discuss characteristic scanning tunneling microscope (STM) images originating from the electronic and structural modifications by the N dopant-defect complexes. STM imaging for small negative bias voltage will provide important information about possible active sites for oxygen reduction reaction. DOI: 10.1103/PhysRevB.87.165401
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页数:16
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