Thin sol-gel bismuth silicate films

被引：12
|
作者：
Klebanskii, EO [1 ]
Kudzin, AY [1 ]
Pasal'skii, VM [1 ]
Plyaka, SN [1 ]
Sadovskaya, LY [1 ]
Sokolyanskii, GK [1 ]
机构：
[1] Dnepropetrovsk State Univ, UA-320625 Dnepropetrovsk, Ukraine
来源：
PHYSICS OF THE SOLID STATE | 1999年 / 41卷 / 06期
关键词：
Spectroscopy; Thin Film; Silicate; State Physics; Absorption Coefficient;
D O I：
10.1134/1.1130903
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The sol-gel method is used to obtain thin films with the composition Bi12SiO20. The characteristic features of the technology for obtaining the films are presented. Diffractometry confirmed that the films possess gamma-Bi2O3-type structure. The transmission spectra of the films were investigated. The spectral dependence of the absorption coefficient of the films matches well with the spectra determined using bulk Bi12SiO20 crystals. (C) 1999 American Institute of Physics. [S1063-7834(99)01606-8].
引用
收藏
页码：913 / 915
页数：3
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