Discrete impurity band from surface danging bonds in nitrogen and phosphorus doped SiC nanowires

被引:25
作者
Li, Yan-Jing [1 ]
Li, Shu-Long [1 ]
Gong, Pei [1 ]
Li, Ya-Lin [1 ]
Cao, Mao-Sheng [2 ]
Fang, Xiao-Yong [1 ]
机构
[1] Yanshan Univ, Sch Sci, Key Lab Microstruct Mat Phys Hebei Prov, Qinhuangdao 066004, Peoples R China
[2] Beijing Inst Technol, Sch Mat Sci & Engn, Beijing 100081, Peoples R China
基金
中国国家自然科学基金;
关键词
Silicon carbon nanowires; Nitrogen and phosphorus doped; Surface danging bonds; Hydrogen passivation; Electronic and optical properties; ELECTRONIC DEVICES; SILICON-CARBIDE; MICROWAVE; COATINGS; EMISSION; OXYGEN;
D O I
10.1016/j.physe.2018.01.006
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The electronic structure and optical properties of the nitrogen and phosphorus doped silicon carbide nanowires (SiCNWs) are investigated using first-principle calculations based on density functional theory. The results show doping can change the type of the band gap and improve the conductivity. However, the doped SiCNWs form a discrete impurity levels at the Fermi energy, and the dispersion degree decreases with the diameter increasing. In order to reveal the root of this phenomenon, we hydrogenated the doped SiCNWs, found that the surface dangling bonds were saturated, and the discrete impurity levels are degeneracy, which indicates that the discrete impurity band of the doped SiCNWs is derived from the dangling bonds. The surface passivation can degenerate the impurity levels. Therefore, both doping and surface passivation can better improve the photoelectric properties of the SiCNWs. The result can provide additional candidates in producing nano-optoelectronic devices.
引用
收藏
页码:191 / 196
页数:6
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