An Improved Calculation of Copper Losses in Integrated Power Inductors on Silicon

被引：30
作者：
Wang, Ningning [1 ]
O'Donnell, Terence [2 ]
O'Mathuna, Cian [1 ]
机构：
[1] Natl Univ Ireland Univ Coll Cork, Tyndall Natl Inst, Cork, Ireland
[2] Enterprise Ireland, Cork, Ireland
来源：
IEEE TRANSACTIONS ON POWER ELECTRONICS | 2013年 / 28卷 / 08期
关键词：
Conductors; eddy currents; skin effect; thin-film inductors; windings; AC RESISTANCE; TRANSFORMER; PERFORMANCE; WINDINGS;
D O I：
10.1109/TPEL.2012.2227805
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Thin-film Si-integrated inductors with closed cores have different magnetic field distributions in the winding window space compared to the inductors with unclosed cores. One-dimensional methods are no longer applicable for these inductors to calculate the ac resistance. Based on the analysis of the magnetic field distribution of the devices, a 2-D field solution was developed, which leads to an improved 2-D method to calculate the ac resistance of the device. High accuracy of this new approach has been verified by finite-element analysis, while 1-D methods can lead to significant errors.
引用
收藏
页码：3641 / 3647
页数：7
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