An Improved Calculation of Copper Losses in Integrated Power Inductors on Silicon

被引：30

作者：

Wang, Ningning ^{[1
]}

O'Donnell, Terence ^{[2
]}

O'Mathuna, Cian ^{[1
]}

机构：

[1] Natl Univ Ireland Univ Coll Cork, Tyndall Natl Inst, Cork, Ireland

[2] Enterprise Ireland, Cork, Ireland

来源：

IEEE TRANSACTIONS ON POWER ELECTRONICS | 2013年 / 28卷 / 08期

关键词：

Conductors; eddy currents; skin effect; thin-film inductors; windings; AC RESISTANCE; TRANSFORMER; PERFORMANCE; WINDINGS;

D O I：

10.1109/TPEL.2012.2227805

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Thin-film Si-integrated inductors with closed cores have different magnetic field distributions in the winding window space compared to the inductors with unclosed cores. One-dimensional methods are no longer applicable for these inductors to calculate the ac resistance. Based on the analysis of the magnetic field distribution of the devices, a 2-D field solution was developed, which leads to an improved 2-D method to calculate the ac resistance of the device. High accuracy of this new approach has been verified by finite-element analysis, while 1-D methods can lead to significant errors.

引用

页码：3641 / 3647

页数：7

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