Surface topographic and transparent film thickness measurements of paper using laser triangulation profilometry.

被引:0
|
作者
Breternitz, E [1 ]
Sung, YJ [1 ]
Elgay, P [1 ]
Luner, P [1 ]
Keller, DS [1 ]
机构
[1] SUNY Coll Environm Sci & Forestry, Empire State Paper Res Inst, Syracuse, NY 13210 USA
关键词
lasers; sensors; roughness; profilometry; film thickness; film coating;
D O I
暂无
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:169 / 169
页数:1
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