Surface topographic and transparent film thickness measurements of paper using laser triangulation profilometry.

被引：0
|
作者：
Breternitz, E [1 ]
Sung, YJ [1 ]
Elgay, P [1 ]
Luner, P [1 ]
Keller, DS [1 ]
机构：
[1] SUNY Coll Environm Sci & Forestry, Empire State Paper Res Inst, Syracuse, NY 13210 USA
来源：
TAPPI ADVANCED COATING FUNDAMENTALS SYMPOSIUM | 1999年
关键词：
lasers; sensors; roughness; profilometry; film thickness; film coating;
D O I：
暂无
中图分类号：
O69 [应用化学];
学科分类号：
081704 ;
摘要：
引用
收藏
页码：169 / 169
页数：1
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