Surface topographic and transparent film thickness measurements of paper using laser triangulation profilometry.

被引：0

作者：

Breternitz, E ^{[1
]}

Sung, YJ ^{[1
]}

Elgay, P ^{[1
]}

Luner, P ^{[1
]}

Keller, DS ^{[1
]}

机构：

[1] SUNY Coll Environm Sci & Forestry, Empire State Paper Res Inst, Syracuse, NY 13210 USA

来源：

TAPPI ADVANCED COATING FUNDAMENTALS SYMPOSIUM | 1999年

关键词：

lasers; sensors; roughness; profilometry; film thickness; film coating;

D O I：

暂无

中图分类号：

O69 [应用化学];

学科分类号：

081704 ;

摘要：

引用

页码：169 / 169

页数：1

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