The dedicated high-resolution grazing-incidence X-ray scattering beamline 8-ID-E at the Advanced Photon Source

被引：115

作者：

Jiang, Zhang ^{[1
]}

Li, Xuefa ^{[1
]}

Strzalka, Joseph ^{[1
]}

Sprung, Michael ^{[1
]}

Sun, Tao ^{[1
]}

Sandy, Alec R. ^{[1
]}

Narayanan, Suresh ^{[1
]}

Lee, Dong Ryeol ^{[1
]}

Wang, Jin ^{[1
]}

机构：

[1] Argonne Natl Lab, Xray Sci Div, Argonne, IL 60439 USA

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2012年 / 19卷

关键词：

X-ray scattering; grazing incidence; coherence; beamline; high resolution; BLOCK-COPOLYMERS; SURFACE-LAYERS; THIN-FILMS; ANGLE; WAVE; MONOLAYERS; MEMBRANES; DESIGN;

D O I：

10.1107/S0909049512022017

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

As an increasingly important structural-characterization technique, grazing-incidence X-ray scattering (GIXS) has found wide applications for in situ and real-time studies of nanostructures and nanocomposites at surfaces and interfaces. A dedicated beamline has been designed, constructed and optimized at beamline 8-ID-E at the Advanced Photon Source for high-resolution and coherent GIXS experiments. The effectiveness and applicability of the beamline and the scattering techniques have been demonstrated by a host of experiments including reflectivity, grazing-incidence static and kinetic scattering, and coherent surface X-ray photon correlation spectroscopy. The applicable systems that can be studied at 8-ID-E include liquid surfaces and nanostructured thin films.

引用

页码：627 / 636

页数：10

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