Permeameter For The Characterization of Magnetic Thin Films Up To 15 GHz

被引：0
|
作者：
Hettstedt, Fall [1 ]
Schuermann, Ulrich [2 ]
Knoechel, Reinhard [1 ]
Quandt, Eckhard [2 ]
机构：
[1] Univ Kiel, Fac Engn, Inst Elect & Informat Engn, Kaiserstr 2, D-24143 Kiel, Germany
[2] Univ Kiel, Fac Engn, Inorga Funct Mat, D-24143 Kiel, Germany
来源：
2008 EUROPEAN MICROWAVE CONFERENCE, VOLS 1-3 | 2008年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a new permeameter for measurement of the complex permeability mu of magnetic thin films up to 15 GHz. The permeameter consists of a strip conductor, which acts as an inductor and is loaded with the magnetic material. The geometry is optimized with respect to sensitivity and self resonance by field simulations using HFSS. A new wideband calibration procedure up to the self resonance frequency of the fixture is also outlined. It utilizes a reference material with known permeability, where the ferromagnetic resonance is shifted by an external magnetic DC field. Frequency dependent calibration factors are introduced. Small residual errors at low frequencies are removed through vibrating sample magnetometer measurements.
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页码：591 / +
页数：2
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