Pyroelectric electron emission from nanometer-thick films of PbZrxTi1-xO3

被引：10

作者：

Fletcher, Patrick C. ^{[1
]}

Mangalam, Vengadesh Kumara R. ^{[2
,3
]}

Martin, Lane W. ^{[2
,3
]}

King, William P. ^{[1
,2
,3
]}

机构：

[1] Univ Illinois, Dept Mech Sci & Engn, Urbana, IL 61801 USA

[2] Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USA

[3] Univ Illinois, Mat Res Lab, Urbana, IL 61801 USA

来源：

APPLIED PHYSICS LETTERS | 2013年 / 102卷 / 19期

关键词：

SINGLE-CRYSTALS; FERROELECTRICS; ENHANCEMENT; MODELS; LINBO3;

D O I：

10.1063/1.4806973

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report pyroelectric emission from PbZrxTi1-xO3 (PZT) thin films on nanometer-sharp tips. The epitaxial PZT films are 30 nm thick and grown directly on single-crystal silicon tips. Pyroelectric emission occurs for heating rates of >= 50 degrees C/min in a 20 V/mu m external field. The emission current is a maximum of 240 nA when the heating rate is 100 degrees C/min and the electric field strength is >= 6.7V/mu m. The emitted charge is similar to 7% of that expected for a perfect thin film emitter of epitaxial PbZrxTi1-xO3. We calculate that pyroelectric emission can occur without an applied field if the heating rate exceeds 4.0 x 10(7) degrees C/min. (C) 2013 AIP Publishing LLC.

引用

页数：5

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