Identification of electron and hole trap based on isothermal surface potential decay model

被引:164
作者
Shen, Wen-Wei [1 ]
Mu, Hai-Bao [1 ]
Zhang, Guan-Jun [1 ]
Deng, Jun-Bo [1 ]
Tu, De-Min [1 ]
机构
[1] Xi An Jiao Tong Univ, Sch Elect Engn, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Shaanxi, Peoples R China
基金
中国国家自然科学基金;
关键词
CHARGE-TRANSPORT; INSULATORS; BREAKDOWN; CURRENTS; SEMICONDUCTORS; INJECTION; MOBILITY; STATES;
D O I
10.1063/1.4792491
中图分类号
O59 [应用物理学];
学科分类号
摘要
For identifying electron and hole traps in polymeric materials, we combine the isothermal relaxation current theory and surface potential decay together and present a model called isothermal surface potential decay (ISPD). A non-contact measurement setup is specially designed, which features that energy distribution of electron or hole-type traps can be discriminated with negative or positive corona charging, respectively. By measuring the ISPD characteristics of low-density polyethylene and polypropylene films, their trap distributions are obtained, revealing the different semi-crystalline morphology of these two materials. The results we obtained may imply the essentially distinct nature of electron/hole traps: inter-chain for electron-type traps and intra-chain for hole-type traps, which is in agreement with other researchers' molecular modeling results. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4792491]
引用
收藏
页数:6
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