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- [3] Electron microscopy study on amorphous Ge-Sb-Te thin film for phase change optical recording JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2003, 42 (10A): : L1158 - L1160
- [4] Electron Microscopy Study on Amorphous Ge-Sb-Te Thin Film for Phase Change Optical Recording Naito, M., 1600, Japan Society of Applied Physics (42):
- [7] In situ transmission electron microscopy study of the crystallization of Ge2Sb2Te5 Kooi, B.J. (b.j.kooi@phys.rug.nl), 1600, American Institute of Physics Inc. (95):
- [9] In situ characterization of vacancy ordering in Ge-Sb-Te phase-change memory alloys FUNDAMENTAL RESEARCH, 2024, 4 (05): : 1235 - 1242
- [10] New pathway for the formation of metallic cubic phase Ge-Sb-Te compounds induced by an electric current Scientific Reports, 6