End-fire mode spectroscopy technique of examination of planar waveguides

被引：3
|
作者：
Svistunov, Dmitry V. [1 ]
机构：
[1] St Petersburg State Polytech Univ, Expt Phys Dept, St Petersburg 195251, Russia
来源：
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS | 2008年 / 10卷 / 08期
关键词：
integrated optics; planar waveguides; buried waveguides; symmetric waveguides; mode index; optical measurements;
D O I：
10.1088/1464-4258/10/8/085301
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A new technique of mode spectrum measurement in planar waveguides is presented. Unlike conventional m-line spectroscopy which does not provide reliable measurements of the whole mode spectra in waveguides with non-monotonic index profiles (in particular, step-index waveguides with thick cover layers or deep-buried graded-index waveguide structures) the proposed technique allows such measurements in any planar waveguides. The developed technique exploits the difference of refraction angles of different modes skew-incident to the output face of the waveguide. The viability of the technique is verified by the comparative study of mode spectra measured by the m-line spectroscopy and the proposed technique.
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页数：4
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