TANDEM-X DSM UNCERTAINTY MEASURES AND DEMONSTRATIONS

被引:0
作者
Rossi, Cristian [1 ]
Fritz, Thomas [1 ]
Eineder, Michael [1 ]
机构
[1] German Aerosp Ctr DLR, Remote Sensing Technol Inst, Wessling, Germany
来源
2015 IEEE INTERNATIONAL GEOSCIENCE AND REMOTE SENSING SYMPOSIUM (IGARSS) | 2015年
关键词
TanDEM-X; uncertainty; DEM; slope; aspect; DEM GENERATION;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
SAR interferometry is a well-known technique to produce digital surface models (DSM). In the global scale, the quality of these models significantly increased with the use of bistatic systems as for the TanDEM-X mission. DSM uncertainty can be measured in two scales: a global and a local one. A global scale analysis involves measures for the complete take, characterizing the whole correctness with a single parameter. A local scale analysis enters instead in the single elevation model cell, evaluating the quality obtained by different terrains and media present in the take. A coherence analysis is a typical measure for InSAR models. Globally, a simple average gives an overall quality measure hint. Locally, it provides a measure of the DSM pixel height error. Unfortunately, this measure lacks in several aspects as not considering unwrapping errors and not being valid for certain types of scattering. In this paper, various strategies for assessing elevation accuracy methods and demonstrate the different capabilities of the bistatic TanDEM-X system are proposed for variegated terrain types.
引用
收藏
页码:3830 / 3833
页数:4
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