Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)

被引:103
作者
Bhaduri, Basanta [1 ]
Mohan, N. Krishna
Kothiyal, M. P.
Sirohi, R. S.
机构
[1] Indian Inst Technol, Dept Phys, Appl Opt Lab, Madras 600036, Tamil Nadu, India
[2] Barkatullah Univ, Bhopal 422026, MP, India
关键词
D O I
10.1364/OE.14.011598
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Digital speckle pattern interferometry ( DSPI) and digital shearography ( DS) are well known optical tools for qualitative as well as quantitative measurements of displacement components and its derivatives of engineering structures subjected either static or dynamic load. Spatial phase shifting ( SPS) technique is useful for extracting quantitative displacement data from the system with only two frames. Optical configurations for DSPI and DS with a double aperture mask in front of the imaging lens for spatial phase shifting are proposed in this paper for the measurement of out-of-plane displacement and its first order derivative ( slope) respectively. An error compensating four-phase step algorithm is used for quantitative fringe analysis. (c) 2006 Optical Society of America.
引用
收藏
页码:11598 / 11607
页数:10
相关论文
共 19 条
[1]  
Burke J., 2000, THESIS C VONOSSIETZK
[2]  
Butter J. N., 1978, SPECKLE METROLOGY
[3]   PHASE-SHIFTING SPECKLE INTERFEROMETRY [J].
CREATH, K .
APPLIED OPTICS, 1985, 24 (18) :3053-3058
[4]  
CREATH K, 1998, PROGR OPTICS, V26
[5]   ROBUST 2-DIMENSIONAL WEIGHTED AND UNWEIGHTED PHASE UNWRAPPING THAT USES FAST TRANSFORMS AND ITERATIVE METHODS [J].
GHIGLIA, DC ;
ROMERO, LA .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1994, 11 (01) :107-117
[6]   Random phase measurement errors in digital speckle pattern interferometry [J].
Huntley, JM .
OPTICS AND LASERS IN ENGINEERING, 1997, 26 (2-3) :131-150
[7]  
KUJAWINSKA M, 1993, INTERFEROGRAM ANAL, pCH5
[8]   INTERFEROMETRIC DISPLACEMENT MEASUREMENT ON SCATTERING SURFACES UTILIZING SPECKLE EFFECT [J].
LEENDERTZ, JA .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (03) :214-+
[9]  
MEINLSCHMIDT P, 1996, SELECTED PAPERS ELEC
[10]   SPECKLE INTERFEROMETRIC METHODS OF MEASURING SMALL OUT-OF-PLANE DISPLACEMENTS [J].
MOHANTY, RK ;
JOENATHAN, C ;
SIROHI, RS .
OPTICS LETTERS, 1984, 9 (11) :475-477