31-Inch 4K Flexible Display Employing Gate Driver With Metal Oxide Thin-Film Transistors

被引:33
作者
Xue, Yan [1 ]
Wang, Longjie [1 ]
Zhang, Yu [1 ]
Liang, Guangmin [1 ]
Chu, Junwei [2 ]
Han, Baixiang [3 ]
Cao, Weiran [3 ]
Liao, Congwei [4 ]
Zhang, Shengdong [4 ]
机构
[1] Shenzhen Polytech, Inst Elect & Commun Engn, Shenzhen 518000, Peoples R China
[2] Xian Inst Appl Opt Natl Def China, Xian 10065, Peoples R China
[3] Shenzhen China Star Optoelect Semicond Display Te, Shenzhen 518000, Peoples R China
[4] Peking Univ, Oxide Semicond Device & Circuit Technol Lab, Shenzhen 518055, Peoples R China
基金
美国国家科学基金会;
关键词
Thin film transistors; Active matrix organic light emitting diodes; Threshold voltage; Reliability; Substrates; Stress; Gate drivers; Flexible active-matrix organic light-emitting diode (AMOLED) display; inkjet printing (IJP); OLED process; top-gated (TG); indium-gallium-zinc oxide (IGZO); thin-film transistors (TFTs); gate driver on the array (GOA); display reliability;
D O I
10.1109/LED.2020.3046228
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 31-inch 4K flexible active-matrix organic light-emitting diode (AMOLED) display integrating with gate driver on the array (GOA) technology has been proposed and fabricated on a polyimide substrate. The GOA circuits, composed of two series-connected thin-film transistors (TFTs) and dual low-voltage power structure, are introduced to decrease the leakage current in TFTs. They are arranged symmetrically along the sides of the display. Inkjet printing (IJP) OLED process is used to reduce the number of sub-pixels from four (R/G/B/W) in commercial white OLED process to three (R/G/B) and a high pixel density in the display (144 pixels per inch) is achieved. Moreover, top-gated (TG) amorphous indium-gallium-zinc oxide (IGZO) TFTs with good electrical and mechanical reliability, have been successfully utilized to decrease the capacitance load in the display and improve signal transfer speed in GOA. Finally, this 31-inch flexible AMOLED display was operated for 500h under accelerating test conditions of 60 degrees C and 90% humidity.
引用
收藏
页码:188 / 191
页数:4
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