46% Peak PAE 28 GHz High Linearity Stacked-FET Power Amplifier IC with a Novel Two-Step Adaptive Bias Circuit in 45-nm SOI CMOS

被引:0
|
作者
Sugiura, Tsuyoshi [1 ,2 ]
Yoshimasu, Toshihiko [1 ,3 ]
机构
[1] Waseda Univ, Sch Fundamental Sci & Engn, Tokyo, Japan
[2] Anritsu Corp, Koriyama, Fukushima, Japan
[3] Waseda Univ, Grad Sch Informat Prod & Syst, Tokyo, Japan
关键词
stacked-FET; adaptive bias; high back-off efficiency; high linearity SOI CMOS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a 28 GHz high linearity power amplifier (PA) IC with a novel two-step adaptively controlled bias circuit for 5th generation (5G) mobile terminal applications in a 45-nm silicon on insulator (SOI) CMOS process. The novel bias circuit adaptively controls the gate voltage of a stacked-FET by a step procedure to improve the 1dB compression point (P1dB) and efficiency in the several-dB backoff region. The PA employs a 3-stacked-FET structure to overcome the low breakdown voltage issue in scaled MOSFETs. At a supply voltage of 3.5 V, the fabricated PA exhibits a peak power added efficiency (PAE) of 46.0%, a saturated output power of 20.5 dBm, a 3 dB output power back-off efficiency of 35.2%, a 6 dB output power back-off efficiency of 26.0% and a small signal gain of 15.0 dB. The PA IC occupies only 0.23 mm(2).
引用
收藏
页码:165 / 168
页数:4
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