Photonic force microscopy of surface electromagnetic waves in a one-dimensional photonic crystal

被引：2
作者：
Shilkin, Daniil A. [1 ]
Lyubin, Evgeny V. [1 ]
Soboleva, Irina V. [1 ,2 ]
Fedyanin, Andrey A. [1 ]
机构：
[1] Moscow MV Lomonosov State Univ, Fac Phys, Moscow 119991, Russia
[2] Russian Acad Sci, AN Frumkin Inst Phys Chem & Electrochem, Moscow 119071, Russia
来源：
OPTICAL TRAPPING AND OPTICAL MICROMANIPULATION XII | 2015年 / 9548卷
关键词：
photonic crystals; surface electromagnetic waves; photonic force microscopy; OPTICAL TWEEZERS; EVANESCENT FIELD; PARTICLES; TRAP; MICROSPHERES; MANIPULATION; EXCITATION; MOVEMENT;
D O I：
10.1117/12.2191547
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The potential of photonic force microscopy (PFM) to directly probe the field of the Bloch surface wave (BSW) in a one-dimensional photonic crystal is considered. Optical forces acting on a dielectric microparticle in the evanescent field of the BSW are estimated in the dipole approximation and calculated by finite-difference time-domain (FDTD) analysis. Technical details of the PFM measurements are described.
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页数：12
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