Die stacking technology for terabit chip-to-chip communications

被引:8
作者
Rahman, Arifur [1 ]
Trezza, John [2 ]
New, Bernie [1 ]
Trimberger, Steve [1 ]
机构
[1] Xilinx Res Labs, 2100 Log Dr, San Jose, CA 95124 USA
[2] Cubic Wafer Inc, Merrimack, NH 03054 USA
来源
PROCEEDINGS OF THE IEEE 2006 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 2006年
关键词
D O I
10.1109/CICC.2006.320826
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper a die stacking technology, leveraging on through die via (TDV) integration and wafer bonding, is presented. Using state-of-the-art volume manufacturing environment, 10:1 aspect ratio TDV and wafer-level bonding technology are developed and initial electrical and reliability characterization results of TDVs are provided. The opportunities for die-stacking technology to alleviate chip-to-chip communication bottleneck are discussed and visions for stacked-die applications, utilizing a programmable virtual backplane, are presented.
引用
收藏
页码:587 / 590
页数:4
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