Dislocation core structures in (0001) InGaN

被引:16
作者
Rhode, S. L. [1 ]
Horton, M. K. [2 ]
Sahonta, S. -L. [1 ]
Kappers, M. J. [1 ]
Haigh, S. J. [3 ,4 ]
Pennycook, T. J. [4 ,5 ]
McAleese, C. [1 ]
Humphreys, C. J. [1 ]
Dusane, R. O. [6 ]
Moram, M. A. [1 ,2 ]
机构
[1] Univ Cambridge, Dept Mat Sci & Met, Charles Babbage Rd, Cambridge CB3 0FS, England
[2] Univ London Imperial Coll Sci Technol & Med, Dept Mat, London SW7 2AZ, England
[3] Univ Manchester, Sch Mat, Manchester M13 9PL, Lancs, England
[4] STFC Daresbury Labs, SuperSTEM, Warrington WA4 4AD, Cheshire, England
[5] Univ Oxford, Dept Mat, Parks Rd, Oxford OX1 3PH, England
[6] Indian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India
基金
英国工程与自然科学研究理事会;
关键词
THREADING DISLOCATION; PHASE-SEPARATION; ATOMIC CONFIGURATIONS; SCREW DISLOCATIONS; QUANTUM-WELLS; PIT FORMATION; GAN; EDGE; FILMS; SEGREGATION;
D O I
10.1063/1.4942847
中图分类号
O59 [应用物理学];
学科分类号
摘要
Threading dislocation core structures in c-plane GaN and InxGa1-xN (0.057 <= x <= 0.20) films were investigated by aberration-corrected scanning transmission electron microscopy. a-type dislocations are unaffected by alloying with indium and have a 5/7-atom ring core structure in both GaN and InxGa1-xN. In contrast, the dissociation lengths of (a+c)-type dislocations are reduced, and new 7/4/9-atom ring and 7/4/8/5-atom ring core structures were observed for the dissociated (a+c)-type dislocations in InxGa1-xN, which is associated with the segregation of indium near (a+c)-type and c-type dislocation cores in InxGa1-xN, consistent with predictions from atomistic Monte Carlo simulations. (C) 2016 AIP Publishing LLC.
引用
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页数:7
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