Comparison Between Potentiometric and Stripping Voltammetric Detection of Trace Metals: Measurements of Cadmium and Lead in the Presence of Thalium, Indium, and Tin

被引:6
作者
Chumbimuni-Torres, Karin Y. [1 ]
Calvo-Marzal, Percy [1 ]
Wang, Joseph [1 ]
机构
[1] Univ Calif San Diego, Dept Nanoengn, La Jolla, CA 92122 USA
关键词
Stripping voltammetry; Potentiometry; Sensitivity; Selectivity; Trace analysis; Cadmium; Lead; ION-SELECTIVE ELECTRODES; DIFFUSION-COEFFICIENTS; DETECTION LIMIT; MATRIX;
D O I
10.1002/elan.200904613
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Recent advances in ion-selective electrodes have pushed the detection limits of direct potentiometry to the nanomolar concentration range. Here we present a direct comparison of the sensitivity and selectivity of potentiometric and stripping-voltammetric measurements of cadmium and lead. While both techniques offer a similar sensitivity, the potentiometric method offers higher selectivity in the presence of excess of metal ions (e.g., thallium, tin) that commonly interfere in the stripping-voltammetric operation. Because of the complementary nature of the potentiometric and stripping-voltammetric methods, it is recommended that these techniques will be selected based on the specific analytical problem or used in parallel to provide additional analytical information.
引用
收藏
页码:1939 / 1943
页数:5
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