From design validation to hardware testing: A unified approach

被引:12
作者
Al-Hayek, G [1 ]
Robach, C [1 ]
机构
[1] INPG, LCIS, F-26902 Valence, France
来源
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 1999年 / 14卷 / 1-2期
关键词
design validation; mutation testing; VHDL;
D O I
10.1023/A:1008317826940
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper we propose a new approach that addresses both the problems of design validation and hardware testing since the early stages of the design flow. The approach consists in adapting the mutation testing, a software method, to circuits described in VHDL. At the functional level, the approach behaves as a design validation method and at the hardware level as a classical ATPG. Standard software test metrics are used for assessing the quality of the design validation process, and the hardware fault coverage for assessing the test quality at the hardware level. An enhancement process that allows design validation to be efficiently reused for hardware testing is detailed. The approach is shown to be efficient upon a set of representative circuits.
引用
收藏
页码:133 / 140
页数:8
相关论文
共 10 条
[1]  
ARMSTRONG JR, 1988, IEEE DES TEST COMPUT, V5, P577
[2]  
CHO CH, 1994, INTERNATIONAL TEST CONFERENCE 1994, PROCEEDINGS, P968, DOI 10.1109/TEST.1994.528046
[3]   HINTS ON TEST DATA SELECTION - HELP FOR PRACTICING PROGRAMMER [J].
DEMILLO, RA ;
LIPTON, RJ .
COMPUTER, 1978, 11 (04) :34-41
[4]   CONSTRAINT-BASED AUTOMATIC TEST DATA GENERATION [J].
DEMILLO, RA ;
OFFUTT, AJ .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1991, 17 (09) :900-910
[5]  
Ghosh S., 1991, Journal of Electronic Testing: Theory and Applications, V2, P135, DOI 10.1007/BF00133499
[6]  
HANSEN M, 1995, IEEE 13 VLSI TEST S, P20
[7]  
LAHAYEK G, 1996, INT TEST C ITC 96 WA, P885
[8]  
LEVENDEL YH, 1982, IEEE T COMPUT, V31, P577, DOI 10.1109/TC.1982.1676054
[9]  
LIN T, 1985, IEEE T COMPUT AID D, V4, P250
[10]  
ONEILL MD, 1989, 9 INT S CHDLS THEIR, P347