Dynamic test planning: a study in an industrial context

被引:14
作者
Carrozza, Gabriella [1 ]
Pietrantuono, Roberto [2 ]
Russo, Stefano [2 ,3 ]
机构
[1] SESM Scarl, Via Circumvallaz Esterna Napoli, I-80014 Naples, Italy
[2] Univ Naples Federico II, DIETI, Via Claudio 21, I-80125 Naples, Italy
[3] Complesso Univ Monte S Angelo, Critiware Spin Off, Incubatore Incipit, Via Cinthia, I-80126 Naples, Italy
关键词
Test planning; Reliability growth model; Resource allocation; Risk-based testing; Mission-critical systems; RELIABILITY GROWTH-MODELS; SOFTWARE-RELIABILITY; METRICS; ALLOCATION;
D O I
10.1007/s10009-014-0319-0
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Testing accounts for a relevant part of the production cost of complex or critical software systems. Nevertheless, time and resources budgeted to testing are often underestimated with respect to the target quality goals. Test managers need engineering methods to perform appropriate choices in spending testing resources, so as to maximize the outcome. We present a method to dynamically allocate testing resources to software components minimizing the estimated number of residual defects and/or the estimated residual defect density. We discuss the application to a real-world critical system in the homeland security domain. We describe a support tool aimed at easing industrial technology transfer by hiding to practitioners the mathematical details of the method application.
引用
收藏
页码:593 / 607
页数:15
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