Complex design of dissipation signals in non-contact atomic force microscopy

被引：12

作者：

Bamidele, J. ^{[1
]}

Li, Y. J. ^{[2
]}

Jarvis, S. ^{[3
]}

Naitoh, Y. ^{[2
]}

Sugawara, Y. ^{[2
]}

Kantorovich, L. ^{[1
]}

机构：

[1] Kings Coll London, Dept Phys, London WC2R 2LS, England

[2] Osaka Univ, Dept Appl Phys, Suita, Osaka 5650871, Japan

[3] Univ Nottingham, Sch Phys & Astron, Nottingham NG7 2RD, England

来源：

PHYSICAL CHEMISTRY CHEMICAL PHYSICS | 2012年 / 14卷 / 47期

基金：

英国工程与自然科学研究理事会;

关键词：

SI(001) SURFACE; GROUND-STATE; MANIPULATION;

D O I：

10.1039/c2cp43121a

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Complex interplay between topography and dissipation signals in Non-Contact Atomic Force Microscopy (NC-AFM) is studied by a combination of state-of-the-art theory and experiment applied to the Si(001) surface prone to instabilities. Considering a wide range of tip-sample separations down to the near-contact regime and several tip models, both stiff and more flexible, a sophisticated architecture of hysteresis loops in the simulated tip force-distance curves is revealed. At small tip-surface distances the dissipation was found to be comprised of two related contributions due to both the surface and tip. These are accompanied by the corresponding surface and tip distortion approach-retraction dynamics. Qualitative conclusions drawn from the theoretical simulations such as large dissipation signals (> 1.0 eV) and a step-like dissipation dependent on the tip-surface distance are broadly supported by the experimental observations. In view of the obtained results we also discuss the reproducibility of NC-AFM imaging.

引用

页码：16250 / 16257

页数：8

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