Review of Temperature Measurement Technology with Infrared Thermal Imager

被引：0
|
作者：
Yao Chuang [1 ]
Duan Minghui [1 ]
He Xin [2 ]
Xi Xiaoguang [1 ]
Zhang Xin [1 ]
Wen Qinfeng [1 ]
Zhu Xuliang [1 ]
Zhu Mingzheng [1 ]
机构：
[1] State Grid Tianjin Elect Power Co, Elect Power Res Inst, Tianjin, Peoples R China
[2] Tianjin Elect Power Sci & Technol Dev Co Ltd, Tianjin, Peoples R China
来源：
2018 CHINA INTERNATIONAL CONFERENCE ON ELECTRICITY DISTRIBUTION (CICED) | 2018年
关键词：
Infrared thermal imager; Temperature measurement technology; Equipment aging; Measurement accuracy; Measurement uniformity;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In order to ensure the continuous and stable operation of power system, the infrared detection technology is introduced. The technology uses infrared thermal imager and other temperature measuring instruments to evaluate the operation state of electrical equipment based on the thermal distribution of equipment. It is one of the most important methods of energized test at present. Infrared detection principle, the application of infrared thermal imager in power system and the influence factors of infrared detection are introduced. Combined with calibration situation of infrared thermal imager in the past two years in a certain area, the necessity of infrared thermal imager calibration is analyzed, to provide reference for the correct use and maintenance of infrared thermal imager.
引用
收藏
页码：1065 / 1067
页数：3
相关论文
共 50 条
  • [21] Altering spectrum method in temperature measurement using infrared imager
    Yang, Zhen
    Zhang, Shicheng
    Yang, Li
    Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 2012, 41 (06): : 1432 - 1437
  • [22] The Influence of Thermal Imager Parameters on the Accuracy of Infrared Thermal Imager
    Zhao, Xia
    Zhao, Zilong
    Guo, Fang
    Zhang, Xiwen
    Shi, Qufei
    Wu, Jian
    2020 IEEE CONFERENCE ON TELECOMMUNICATIONS, OPTICS AND COMPUTER SCIENCE (TOCS), 2020, : 1 - 4
  • [23] Accurate measuring temperature with infrared thermal imager in the unstable condition of ambient temperature
    Wang Jing
    Qu En-shi
    Cao Jian-zhong
    2011 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS, 2011, 8201
  • [24] Advancements in temperature measurement: Infrared technology
    Garite, P
    Klein, K
    AMERICAN LABORATORY, 2000, 32 (23) : 26 - 26
  • [25] Compact thermal imager: a flight demonstration of infrared technology for Earth observations
    Jennings, D. E.
    Jhabvala, M. D.
    Tucker, C. J.
    Lunsford, A. W.
    La, A. T.
    Flatley, T. P.
    Choi, K. K.
    Wu, D. L.
    Morton, D. C.
    Holmes, T. R.
    Fitts, Y.
    Cappelaere, P. G.
    Cillis, A. N.
    Turck, K. A.
    Hewagama, T.
    APPLIED OPTICS, 2022, 61 (14) : 4215 - 4225
  • [26] Removing temperature drift and temporal variation in thermal infrared images of a UAV uncooled thermal infrared imager
    Wang, Ziwei
    Zhou, Ji
    Ma, Jin
    Wang, Yong
    Liu, Shaomin
    Ding, Lirong
    Tang, Wenbin
    Pakezhamu, Nuradili
    Meng, Lingxuan
    ISPRS JOURNAL OF PHOTOGRAMMETRY AND REMOTE SENSING, 2023, 203 : 392 - 411
  • [27] A $10 thermal infrared imager
    Hobbs, PCD
    SENSORS AND CONTROLS FOR INTELLIGENT MANUFACTURING II, 2001, 4563 : 42 - 51
  • [28] Experimental study on emissivity setting before precise temperature measurement of SiCp/Al cutting by infrared thermal imager
    Zhang Q.
    Li G.
    Sun Y.
    Sun F.
    Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 2022, 51 (06):
  • [29] Application of Thermal Infrared Imager to Measure Temperature in Cooling Water Models
    Tong Zhongshan
    Wang Yong
    Xu Shikai
    Ruan Shiping
    ADVANCES IN HYDRAULIC PHYSICAL MODELING AND FIELD INVESTMENT AND INVESTIGATION, 2010, : 421 - 423
  • [30] NEURAL NETWORK BASED CORRECTION OF INFRARED THERMAL IMAGER FOR SHORT DISTANCE MEASUREMENT
    Sun Jian
    Zheng Enhui
    Chen Le
    Huang Yanyan
    Fu Yaqiong
    XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS, 2009, : 1497 - 1499
12345