Cavity Beam Position Monitor Test System Based On Virtual Instrument

被引：0

作者：

Wang Baopeng ^{[1
]}

Leng Yongbin ^{[1
]}

Zhou Weimin ^{[1
]}

Yu Luyang ^{[1
]}

Yan Yingbing ^{[1
]}

机构：

[1] Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China

来源：

MEASUREMENT TECHNOLOGY AND ENGINEERING RESEARCHES IN INDUSTRY, PTS 1-3 | 2013年 / 333-335卷

关键词：

Cavity Beam Position monitor; Test system; Virtual Instrument; Auto control;

D O I：

10.4028/www.scientific.net/AMM.333-335.2354

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

Based on the virtual instrument technology, a dedicated test system has been developed for cavity beam position monitor (CBPM). The system consists of commercial nano-positioning stage and its controller, the analog output DAQ card based on PXI and network analyzer. In the LAB VIEW environment, software which implemented function of instrument control and data acquisition based on virtual instrument soft architecture (VISA) has been developed. Experimental results illustrated that the test system achieved positioning precision of sub micron which meets requirement of test of CBPM. Also it could serve CBPM signal processing system.

引用

页码：2354 / 2357

页数：4

共 6 条

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[2] [Anonymous], PXI 6711 DAT
[3] [Anonymous], P527 DAT
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