Reliability- and process-variation aware design of integrated circuits

被引：71

作者：

Alam, M. ^{[1
]}

机构：

[1] Purdue Univ, Network Computat Nanotechnol, W Lafayette, IN 47907 USA

来源：

MICROELECTRONICS RELIABILITY | 2008年 / 48卷 / 8-9期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/j.microrel.2008.07.039

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We review the literature for reliability- and process-variation aware VLSI design to find that an exciting area of research/application is rapidly emerging as a core topic of IC design. Design of reliable circuits With unreliable components is a significant challenge that is likely to remain relevant for all circuit designs from now on, therefore any contribution in this field is likely to have lasting effect oil the design philosophy of integrated circuits. (c) 2008 Elsevier Ltd. All rights reserved.

引用

页码：1114 / 1122

页数：9

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