Lateral force modulation atomic force microscopy

被引:0
作者
Yamanaka, K [1 ]
机构
[1] Tohoku Univ, Grad Sch Engn, Dept Mat Proc, Aoba Ku, Sendai, Miyagi 9808579, Japan
关键词
atomic force microscopy; modulation; friction; elasticity; stick slip;
D O I
暂无
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
引用
收藏
页码:868 / 874
页数:7
相关论文
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