Vapor Phase Sensing Using Metal Nanorod Thin Films Grown by Cryogenic Oblique Angle Deposition

被引:7
|
作者
Shah, Piyush [1 ]
Ju, Dongquan [2 ]
Niu, Xiaoxu [3 ]
Sarangan, Andrew M. [1 ]
机构
[1] Univ Dayton, Electroopt Grad Program, Dayton, OH 45469 USA
[2] Harbin Inst Technol, Dept Phys, Harbin 150001, Peoples R China
[3] Univ Dayton, Grad Mat Engn Program, Dayton, OH 45469 USA
关键词
ENHANCED RAMAN-SPECTROSCOPY; MASS SPECTROMETRY; OPTICAL-CONSTANTS; GAS-PHASE; ARRAYS; SCATTERING;
D O I
10.1155/2013/823041
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrate the chemical sensing capability of silver nanostructured films grown by cryogenic oblique angle deposition (OAD). For comparison, the films are grown side by side at cryogenic (similar to 100 K) and at room temperature (similar to 300 K) by e-beam evaporation. Based on the observed structural differences, it was hypothesized that the cryogenic OAD silver films should show an increased surface enhanced Raman scattering (SERS) sensitivity. COMSOL simulation results are presented to validate this hypothesis. Experimental SERS results of 4-aminobenzenethiol (4-ABT) Raman test probe molecules in vapor phase show good agreement with the simulation and indicate promising SERS applications for these nanostructured thin films.
引用
收藏
页数:6
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