Optical properties of InN films grown by pressurized-reactor metalorganic vapor phase epitaxy

被引:11
作者
Zhang, Yuantao [1 ,2 ]
Kimura, Takeshi [1 ]
Prasertusk, Kiattiwut [1 ]
Iwabuchi, Takuya [1 ]
Kumar, Suresh [1 ]
Liu, Yuhuai [1 ]
Katayama, Ryuji [1 ]
Matsuoka, Takashi [1 ]
机构
[1] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan
[2] Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Changchun 130012, Peoples R China
基金
日本学术振兴会; 中国国家自然科学基金;
关键词
Indium nitride; Thin films; Optical properties; Metalorganic vapor phase epitaxy; FUNDAMENTAL-BAND GAP; TEMPERATURES; ABSORPTION; WURTZITE; PURITY; STATES; MOVPE;
D O I
10.1016/j.tsf.2013.04.004
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
InN thin films have been grown using a pressurized-reactor metalorganic vapor phase epitaxy system at 500-700 degrees C under the pressure of 2.1 x 10(5) Pa. Photoluminescence (PL), optical reflectance and transmission measurements were performed at room temperature. We found that optical properties of these as-grown films strongly depend on the growth temperature. By analyzing the reflectance spectra, it is found that the calculated carrier concentrations of the films increased with decreasing growth temperature. Room-temperature photoluminescence spectra show that the films grown at temperatures higher than 575 degrees C have strong emission peaks at 0.68-0.75 eV, while those grown at temperatures lower than and equal to 575 degrees C have negligible emission. The quenching of the emission is attributed to the existences of cubic InN and a high-density of nonradiative recombination centers in the films grown at low growth temperature region. Especially for the case of high temperature growth, the growth temperature dependence of the absorption-edge energy shows a similar tendency with that of the PL peak energy, both blue-shifted with decreasing the growth temperature possibly due to the well-known Burstein-Moss effects. From these results, an optimum growth temperature of 675 degrees C in the pressurized growth could be obtained. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:152 / 155
页数:4
相关论文
共 17 条
[1]  
Davydov VY, 2002, PHYS STATUS SOLIDI B, V229, pR1, DOI 10.1002/1521-3951(200202)229:3<R1::AID-PSSB99991>3.0.CO
[2]  
2-O
[3]   Photoluminescence of cubic InN films on MgO (001) substrates [J].
Inoue, T. ;
Iwahashi, Y. ;
Oishi, S. ;
Orihara, M. ;
Hijikata, Y. ;
Yaguchi, H. ;
Yoshida, S. .
PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 6, 2008, 5 (06) :1579-1581
[4]   Infrared measurements of InN films at low temperatures [J].
Ishitani, Y ;
Xu, K ;
Terashima, W ;
Hashimoto, N ;
Yoshitani, M ;
Hata, T ;
Yoshikawa, A .
5TH INTERNATIONAL CONFERENCE ON NITRIDE SEMICONDUCTORS (ICNS-5), PROCEEDINGS, 2003, 0 (07) :2838-2841
[5]  
Iwabuchi T., 2012, 59 SPRING M JAP SOC, V17a-B10-8
[6]   Effect of Phase Purity on Dislocation Density of Pressurized-Reactor Metalorganic Vapor Phase Epitaxy Grown InN [J].
Iwabuchi, Takuya ;
Liu, Yuhuai ;
Kimura, Takeshi ;
Zhang, Yuantao ;
Prasertsuk, Kiattiwut ;
Watanabe, Haruna ;
Usami, Noritaka ;
Katayama, Ryuji ;
Matsuoka, Takashi .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2012, 51 (04)
[7]   Phase diagram on phase purity of InN grown pressurized-reactor MOVPE [J].
Kimura, Takeshi ;
Prasertsuk, Kiattiwut ;
Zhang, Yuantao ;
Liu, Yuhuai ;
Hanada, Takashi ;
Katayama, Ryuji ;
Matsuoka, Takashi .
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 9, NO 3-4, 2012, 9 (3-4) :654-657
[8]   Crystalline structure changes in GaN films grown at different temperatures [J].
Lin, HC ;
Ou, J ;
Chen, WK ;
Chen, WH ;
Lee, MC .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1997, 36 (5B) :L598-L600
[9]   Optical bandgap energy of wurtzite InN [J].
Matsuoka, T ;
Okamoto, H ;
Nakao, M ;
Harima, H ;
Kurimoto, E .
APPLIED PHYSICS LETTERS, 2002, 81 (07) :1246-1248
[10]   The relationship between the distribution of electronic states and the optical absorption spectrum of an amorphous semiconductor: An empirical analysis [J].
OLeary, SK ;
Johnson, SR ;
Lim, PK .
JOURNAL OF APPLIED PHYSICS, 1997, 82 (07) :3334-3340