Analysis of Lattice Distortion in Multicrystalline Silicon for Photovoltaic Cells by Synchrotron White X-ray Microbeam Diffraction

被引：1

作者：

Shimura, Takayoshi ^{[1
]}

Matsumiya, Takuya ^{[1
]}

Morimoto, Naoki ^{[1
]}

Hosoi, Takuji ^{[1
]}

Kajiwara, Kentaro ^{[2
]}

Chen, Jun ^{[3
]}

Sekiguchi, Takashi ^{[3
]}

Watanabe, Heiji ^{[1
]}

机构：

[1] Osaka Univ, Grad Sch Engn, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan

[2] Japan Synchrotron Radiat Res Inst, Hyogo 6795198, Japan

[3] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050044, Japan

来源：

DEFECTS-RECOGNITION, IMAGING AND PHYSICS IN SEMICONDUCTORS XIV | 2012年 / 725卷

关键词：

Multicrystalline silicon; Synchrotron radiation; Grain boundary; X-ray microbeam; Lattice strain; X-ray topography; GRAIN-BOUNDARIES; BEAM;

D O I：

10.4028/www.scientific.net/MSF.725.153

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A synchrotron white x-ray microbeam diffraction method was employed to investigate lattice distortion in multicrystalline silicon for photovoltaic cells. The measurements were carried out by scanning the sample, and transmission Laue patterns were observed at each position on the sample. Intensity and position maps of the Laue spots showed the distribution of the crystalline quality of the grains and the bending of the lattice planes. Strain and bending distributions were extracted from an analysis of Laue spots at diagonal positions, and these were compared with those obtained by other techniques.

引用

页码：153 / +

页数：2

共 50 条

[31] A microbeam X-ray diffraction study of insulin spherulites
Yagi, N.
Ohta, N.
Lida, T.
Inoue, K.
JOURNAL OF MOLECULAR BIOLOGY, 2006, 362 (02) : 327 - 333
[32] A NOVEL FORM OF X-RAY DIFFRACTION MICROBEAM CAMERA
ORON, M
MINKOFF, I
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1965, 42 (05): : 337 - &
[33] White beam synchrotron X-ray topography and X-ray diffraction measurements of epitaxial lateral overgrowth of GaN
Chen, WM
McNally, PJ
Jacobs, K
Tuomi, T
Danilewsky, AN
Lowney, D
Kanatharana, J
Knuuttila, L
Riikonen, J
GAN AND RELATED ALLOYS-2001, 2002, 693 : 141 - 146
[34] Analysis of matrix characterization by X-ray diffraction and synchrotron radiation
Barroso, RC
Anjos, MJ
Lopes, RT
de Jesus, EFO
Braz, D
Castro, CRF
Uhl, A
RADIATION PHYSICS AND CHEMISTRY, 2002, 65 (4-5) : 501 - 505
[35] Strain analysis in composites using synchrotron X-ray diffraction
Wells, KE
Korsunsky, AM
EXPERIMENTAL MECHANICS, VOLS 1 AND 2: ADVANCES IN DESIGN, TESTING AND ANALYSIS, 1998, : 761 - 766
[36] Anomalous X-ray diffraction with soft X-ray synchrotron radiation
Carpentier, P
Berthet-Colominas, C
Capitan, M
Chesne, ML
Fanchon, E
Lequien, S
Stuhrmann, H
Thiaudière, D
Vicat, J
Zielinski, P
Kahn, R
CELLULAR AND MOLECULAR BIOLOGY, 2000, 46 (05) : 915 - 935
[37] Nondestructive Measurement of the Residual Stresses in Copper Through-Silicon Vias Using Synchrotron-Based Microbeam X-Ray Diffraction
Okoro, Chukwudi
Levine, Lyle E.
Xu, Ruqing
Hummler, Klaus
Obeng, Yaw S.
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2014, 61 (07) : 2473 - 2479
[38] Synchrotron microbeam x-ray radiation damage in semiconductor layers
Polvino, Sean M.
Murray, Conal E.
Kalenci, Oezgur
Noyan, I. C.
Lai, Barry
Cai, Zhoghou
APPLIED PHYSICS LETTERS, 2008, 92 (22)
[39] Morphology of α-transcrystalline isotactic polypropylene under tensile stress studied with synchrotron microbeam X-ray diffraction
Assouline, E
Grigull, S
Marom, G
Wachtel, E
Wagner, HD
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS, 2001, 39 (17) : 2016 - 2021
[40] Spin-driven crystal lattice distortion in frustrated magnet CuFeO2:: Synchrotron X-ray diffraction study
Terada, N
Mitsuda, S
Ohsumi, H
Tajima, K
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 2006, 75 (02)

← 1 2 3 4 5 →